A method is presented for modeling application performance on parallel computers in terms of the performance of microkernels from the HPC Challenge benchmarks. Specifically, the a...
Process variations are poised to significantly degrade performance benefits sought by moving to the next nanoscale technology node. Parameter fluctuations in devices can introd...
In an errors-in-variables (EIV) model, all the measurements are corrupted by noise. The class of EIV models with constraints separable into the product of two nonlinear functions, ...
Cloud computing has seen tremendous growth, particularly for commercial web applications. The on-demand, pay-as-you-go model creates a flexible and cost-effective means to access c...
Keith R. Jackson, Lavanya Ramakrishnan, Krishna Mu...
Process variations in modern VLSI technologies are growing in both magnitude and dimensionality. To assess performance variability, complex simulation and performance models param...