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FPGA
2007
ACM
142views FPGA» more  FPGA 2007»
14 years 1 months ago
Parametric yield in FPGAs due to within-die delay variations: a quantitative analysis
Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...
N. Pete Sedcole, Peter Y. K. Cheung
TSP
2010
13 years 2 months ago
A new parametric GLRT for multichannel adaptive signal detection
A parametric generalized likelihood ratio test (GLRT) for multichannel signal detection in spatially and temporally colored disturbance was recently introduced by modeling the dist...
Pu Wang, Hongbin Li, Braham Himed
DAC
2004
ACM
14 years 1 months ago
Parametric yield estimation considering leakage variability
Leakage current has become a stringent constraint in today’s processor designs in addition to traditional constraints on frequency. Since leakage current exhibits a strong inver...
Rajeev R. Rao, Anirudh Devgan, David Blaauw, Denni...
CAD
2005
Springer
13 years 7 months ago
Parameterization and parametric design of mannequins
This paper presents a novel feature based parameterization approach of human bodies from the unorganized cloud points and the parametric design method for generating new models ba...
Charlie C. L. Wang
IJCAI
1993
13 years 9 months ago
Nonmonotonic Model Inference-A Formalization of Student Modeling
A student model description language and its synthesis method are presented. The language called SMDL is based on a logic programming language taking 4 truth values such as true, ...
Mitsuru Ikeda, Yasuyuki Kono, Riichiro Mizoguchi