20 search results - page 2 / 4 » Partial Order Reduction for Detecting Safety and Timing Fail... |
ICCD
1999
IEEE
13 years 11 months ago
1999
IEEE
ions", in IEEE Transactions on CAD of VLSI, 25(3):403-412, March, 2006. , E. Mercer, C. Myers, "Modular Verification of Timed Systems Using Automatic Abstraction" in...
ICCAD
1997
IEEE
13 years 11 months ago
1997
IEEE
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
VTS
1997
IEEE
13 years 11 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
DATE
2010
IEEE
14 years 16 days ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
EDCC
2008
Springer
13 years 9 months ago
2008
Springer
This work addresses the problem of software fault diagnosis in complex safety critical software systems. The transient manifestations of software faults represent a challenging is...