114 search results - page 13 / 23 » Path-based fault correlations |
DAC
1996
ACM
13 years 11 months ago
1996
ACM
The testability of basic DSP datapath structures using pseudorandom built-in self-test techniques is examined. The addition of variance mismatched signals is identified as a testi...
ICSM
2007
IEEE
14 years 1 months ago
2007
IEEE
Parallel developments are becoming increasingly prevalent in the building and evolution of large-scale software systems. Our previous studies of a large industrial project showed ...
VTS
2006
IEEE
14 years 1 months ago
2006
IEEE
A statistical technique X-IDDQ for extracting defect information from IDDQ data is presented that is effective for detection of defects in ICs. The technique treats the IDDQ measu...
DFT
2005
IEEE
13 years 9 months ago
2005
IEEE
A built-in self-test (BIST) scheme is presented which both reduces overhead for detecting random-pattern-resistant (r.p.r.) faults as well as reduces power consumption during test...
RTAS
2005
IEEE
14 years 1 months ago
2005
IEEE
Abstract— The increasing use of electronics in transport systems, such as the automotive and avionic domain, has lead to dramatic improvements with respect to functionality, safe...