114 search results - page 15 / 23 » Path-based fault correlations |
DAC
2006
ACM
14 years 8 months ago
2006
ACM
For a space compactor, degradation of fault detection capability caused by the masking effects from unknown values is much more serious than that caused by error masking (i.e. ali...
ASPDAC
2006
ACM
14 years 1 months ago
2006
ACM
This paper presents a case-study of delay defect screening applied to Fujitsu 2.16GHz SPARC64 microprocessor. A nonrobust delay test is used while each test vector is compacted to...
DSN
2002
IEEE
14 years 12 days ago
2002
IEEE
Traditional problem determination techniques rely on static dependency models that are difficult to generate accurately in today’s large, distributed, and dynamic application e...
IPPS
2000
IEEE
13 years 12 months ago
2000
IEEE
The Network Weather Service NWS is a distributed resource monitoring and utilization prediction system, employed as an aid to scheduling jobs in a metacomputing environment 9, 1...
VTS
1998
IEEE
13 years 11 months ago
1998
IEEE
An experimental test chip was designed and manufactured to evaluate different test techniques. Based on the results presented in the wafer probe, 309 out of 5491 dies that passed ...