758 search results - page 106 / 152 » Pattern-Constrained Test Case Generation |
DAC
2012
ACM
12 years 1 months ago
2012
ACM
In this work we address the problem of managing interconnect timing in high-level synthesis by generating a layoutfriendly microarchitecture. A metric called spreading score is pr...
ACL
2012
12 years 1 months ago
2012
We propose a latent variable model to enhance historical analysis of large corpora. This work extends prior work in topic modelling by incorporating metadata, and the interactions...
DATE
2007
IEEE
14 years 5 months ago
2007
IEEE
Error-tolerance is an innovative way to enhance the effective yield of IC products. Previously a test methodology based on error-rate estimation to support error-tolerance was pro...
FCCM
2007
IEEE
14 years 5 months ago
2007
IEEE
This paper proposes optimizations of the methods and parameters used in both mathematical approximation and hardware design for logarithmic number system (LNS) arithmetic. First, ...
ML
2010
ACM
13 years 9 months ago
2010
ACM
In several domains it is common to have data from different, but closely related problems. For instance, in manufacturing, many products follow the same industrial process but with...