758 search results - page 108 / 152 » Pattern-Constrained Test Case Generation |
DAC
2007
ACM
14 years 2 months ago
2007
ACM
We present a framework for validating the compliance of a design with a given architecture. Our approach is centered on the concept of misinterpretations. These include missing be...
VTS
2005
IEEE
14 years 4 months ago
2005
IEEE
This paper presents a pseudo-functional BIST scheme that attempts to minimize the over-testing problem of logic BIST for delay and crosstalk-induced failures. The over-testing pro...
AUSAI
2005
Springer
14 years 4 months ago
2005
Springer
Abstract. We present a Lagrangian-based heuristic LAHA for the Winner Determination Problem in Combinatorial Auctions. The algorithm makes use of the market computing power by appl...
COMPSAC
2009
IEEE
14 years 5 months ago
2009
IEEE
—This paper considers the task of software test case generation from a large space of values of input parameters. The purpose of the paper is to create a model of software input ...
DATE
2008
IEEE
14 years 5 months ago
2008
IEEE
Due to high demand for hall sensors mostly in the automotive and industrial applications, development and manufacturing of hall sensors in System-on-Chip (SoC) became more importa...