758 search results - page 58 / 152 » Pattern-Constrained Test Case Generation |
68
Voted
ITC
2003
IEEE
15 years 7 months ago
2003
IEEE
Backside light emission and electrical measurements were used to evaluate the susceptibility to latchup of externally cabled I/O pins for a 0.13 µm technology generation [1,2] te...
106
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MTDT
2000
IEEE
15 years 7 months ago
2000
IEEE
In this work, we present the application of Generalized Linear Feedback Shift Registers (GLFSRs) for generation of patterns for pseudo-random memory Built-In SelfTest (BIST). Rece...
105
Voted
ECIS
2003
15 years 4 months ago
2003
One of the primary methods employed by researchers to judge the merits of new heuristics and algorithms is to run them on accepted benchmark test cases and comparing their perform...
115
Voted
GECCO
2004
Springer
15 years 8 months ago
2004
Springer
Software systems are used regularly in safety-relevant applications. Therefore, the occurrence of critical defects may not only cause costly recalls but may also endanger human liv...
99
Voted
IFM
2005
Springer
15 years 8 months ago
2005
Springer
We provide an automatic method for calculating the path condition for programs with real time constraints. This method can be used for the semiautomatic verification of a unit of ...