5799 search results - page 27 / 1160 » Patterns Generate Architectures |
VTS
2005
IEEE
14 years 1 months ago
2005
IEEE
TARO test patterns are transition fault test patterns that sensitize each transition fault to all of the outputs that can be reached from the fault location. We were not able to i...
SIGSOFT
2007
ACM
14 years 8 months ago
2007
ACM
The testing of the performance of opportunistic communication protocols and applications is usually done through simulation as i) deployments are expensive and should be left to t...
ACL
2008
13 years 9 months ago
2008
We present a novel framework for the discovery and representation of general semantic relationships that hold between lexical items. We propose that each such relationship can be ...
ISPASS
2006
IEEE
14 years 1 months ago
2006
IEEE
Applications in Computer Networks often require high throughput access to large data structures for lookup and classification. Many advanced algorithms exist to speed these searc...
DAC
2010
ACM
13 years 11 months ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...