Existing built-in self test (BIST) strategies require the use of specialized test pattern generation hardware which introduces signicant area overhead and performance degradation...
This paper presents a novel approach for automatic test pattern generation of asynchronous circuits. The techniques used for this purpose assume that the circuit can only be exerc...
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...
Mehrdad Nourani, Mohammad Tehranipoor, Nisar Ahmed
The mobile user can interact with devices in the environment using either the devices themselves or a device she carries with her. This requires an adaption of the user interface t...