5799 search results - page 3 / 1160 » Patterns Generate Architectures |
AR
2008
13 years 8 months ago
2008
In this paper we describe the use of design patterns as a basis for creating a Humanoid Walking Pattern Generator Software having a modular architecture. This architecture made po...
AOSD
2007
ACM
13 years 11 months ago
2007
ACM
Developing and debugging parallel programs particularly for distributed memory architectures is still a difficult task. The most popular approach to developing parallel programs f...
DAC
1997
ACM
13 years 12 months ago
1997
ACM
This paper presents a new scan-based BIST scheme which achieves very high fault coverage without the deficiencies of previously proposed schemes. This approach utilizes scan order...
DAC
2003
ACM
14 years 1 months ago
2003
ACM
We present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern gener...
VLSID
2002
IEEE
14 years 8 months ago
2002
IEEE
We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...