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DATE
2003
IEEE
62views Hardware» more  DATE 2003»
14 years 1 months ago
RTL Test Pattern Generation for High Quality Loosely Deterministic BIST
Marcelino B. Santos, José M. Fernandes, Isa...
ATS
2000
IEEE
86views Hardware» more  ATS 2000»
14 years 11 days ago
An adjacency-based test pattern generator for low power BIST design
Patrick Girard, Loïs Guiller, Christian Landr...
ATS
1998
IEEE
106views Hardware» more  ATS 1998»
14 years 6 days ago
A Test Pattern Generation Algorithm Exploiting Behavioral Information
This paper aims at broadening the scope of hierarchical ATPG to the behavioral-level The main problem of using behavioral information for ATPG is the mismatch of timing models bet...
Silvia Chiusano, Fulvio Corno, Paolo Prinetto