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GLVLSI
1997
IEEE
131views VLSI» more  GLVLSI 1997»
14 years 5 days ago
Analog Circuit Model of Lamprey Unit Pattern Generator
Elizabeth J. Brauer, Ranu Jung, Denise M. Wilson, ...
GLVLSI
1997
IEEE
92views VLSI» more  GLVLSI 1997»
14 years 5 days ago
An Efficient Dynamic Parallel Approach to Automatic Test Pattern Generation
H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor V...
VTS
1996
IEEE
75views Hardware» more  VTS 1996»
14 years 3 days ago
A new test pattern generation method for delay fault testing
S. Cremoux, Christophe Fagot, Patrick Girard, Chri...
DATE
2004
IEEE
158views Hardware» more  DATE 2004»
13 years 11 months ago
Automatic Scan Insertion and Pattern Generation for Asynchronous Circuits
This paper presents 3LSSD, a novel, easilyautomatable approach for scan insertion and ATPG of asynchronous circuits. 3LSSD inserts scan latches only into global circuit feedback p...
Aristides Efthymiou, Christos P. Sotiriou, Douglas...
KDD
2000
ACM
78views Data Mining» more  KDD 2000»
13 years 11 months ago
Depth first generation of long patterns
Ramesh C. Agarwal, Charu C. Aggarwal, V. V. V. Pra...