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» Patterns for Refinement Automation
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DAC
2000
ACM
14 years 10 months ago
Self-test methodology for at-speed test of crosstalk in chip interconnects
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
Xiaoliang Bai, Sujit Dey, Janusz Rajski
DAC
2002
ACM
14 years 10 months ago
Exploiting shared scratch pad memory space in embedded multiprocessor systems
In this paper, we present a compiler strategy to optimize data accesses in regular array-intensive applications running on embedded multiprocessor environments. Specifically, we p...
Mahmut T. Kandemir, J. Ramanujam, Alok N. Choudhar...
DAC
2003
ACM
14 years 10 months ago
Seed encoding with LFSRs and cellular automata
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the PRPG before filling the scan chain. In this paper, we present...
Ahmad A. Al-Yamani, Edward J. McCluskey
DAC
2003
ACM
14 years 10 months ago
Making cyclic circuits acyclic
Cyclic circuits that do not hold state or oscillate are often the most convenient representation for certain functions, such as arbiters, and can easily be produced inadvertently ...
Stephen A. Edwards
DAC
2004
ACM
14 years 10 months ago
Profile-guided microarchitectural floorplanning for deep submicron processor design
As process technology migrates to deep submicron with feature size less than 100nm, global wire delay is becoming a major hindrance in keeping the latency of intra-chip communicat...
Mongkol Ekpanyapong, Jacob R. Minz, Thaisiri Watew...