In this paper, we present a novel multigrid-based technique for power/ground mesh area optimization subject to reliability constraints. The multigrid-based technique is applied to...
Abstract--Network performance can be increased if the traditionally separated network layers are jointly optimized. Recently, network utility maximization has emerged as a powerful...
As transistor process technology approaches the nanometer scale, process variation significantly affects the design and optimization of high performance microprocessors. Prior stu...
We present a framework for designing, in a declarative and flexible way, efficient migration programs and an undergoing implementation of a migration tool called RelOO whose targe...
In nanometer regime, the effects of process variations are dominating circuit performance, power and reliability of circuits. Hence, it is important to properly manage variation e...