301 search results - page 10 / 61 » Physical design techniques for optimizing RTA-induced variat... |
DATE
2003
IEEE
14 years 1 months ago
2003
IEEE
In this paper, we present a novel multigrid-based technique for power/ground mesh area optimization subject to reliability constraints. The multigrid-based technique is applied to...
JSAC
2006
13 years 8 months ago
2006
Abstract--Network performance can be increased if the traditionally separated network layers are jointly optimized. Recently, network utility maximization has emerged as a powerful...
HPCA
2009
IEEE
14 years 3 months ago
2009
IEEE
As transistor process technology approaches the nanometer scale, process variation significantly affects the design and optimization of high performance microprocessors. Prior stu...
VLDB
1998
ACM
14 years 19 days ago
1998
ACM
We present a framework for designing, in a declarative and flexible way, efficient migration programs and an undergoing implementation of a migration tool called RelOO whose targe...
ISVLSI
2008
IEEE
14 years 2 months ago
2008
IEEE
In nanometer regime, the effects of process variations are dominating circuit performance, power and reliability of circuits. Hence, it is important to properly manage variation e...