301 search results - page 18 / 61 » Physical design techniques for optimizing RTA-induced variat... |
PATMOS
2007
Springer
14 years 2 months ago
2007
Springer
Abstract. The continuous miniaturization of semiconductor devices imposes serious threats to design robustness against process variations and environmental fluctuations. Modern ci...
INTEGRATION
2008
13 years 8 months ago
2008
Variation is a significant concern in nanometer-scale CMOS due to manufacturing equipment being pushed to fundamental limits, particularly in lithography. In this paper, we review...
ICRA
1998
IEEE
14 years 21 days ago
1998
IEEE
Good robot performance often relies upon the selection of design parameters that lead to a well conditioned Jacobian or impedance "design" matrix. In this paper, a new d...
ASPDAC
2008
ACM
13 years 10 months ago
2008
ACM
Abstract-- Increasing delay and power variation are significant challenges to the designers as technology scales to the deep sub-micron (DSM) regime. Traditional module selection t...
DAC
1999
ACM
14 years 9 months ago
1999
ACM
Partitioning and clustering are crucial steps in circuit layout for handling large scale designs enabled by the deep submicron technologies. Retiming is an important sequential lo...