1419 search results - page 23 / 284 » Power Droop Testing |
VTS
2005
IEEE
14 years 3 months ago
2005
IEEE
This paper presents a test architecture that addresses multiple problems faced in digital IC testing. These problems are test data volume, test application time, test power consum...
ISQED
2003
IEEE
14 years 3 months ago
2003
IEEE
An algorithm for mapping core terminals to System-On-a-Chip (SOC) I/O pins and scheduling tests in order to achieve costefficient concurrent test for core-based designs is present...
SC
1994
ACM
14 years 1 months ago
1994
ACM
Most current data dependence tests cannot handle loop bounds or array subscripts that are symbolic, nonlinear expressions e.g. Ani+j, where 0 j n. In this paper, we describe a d...
SOCC
2008
IEEE
14 years 4 months ago
2008
IEEE
An in-situ self-aware adaptive power control (APC) system is presented in this paper. This APC system consists of a voltage sensor, a variable threshold comparator, slack detectio...
ATS
2005
IEEE
14 years 3 months ago
2005
IEEE
— Structural transformation of a design to enhance its testability while satisfying design constraints on power and performance, can result in improved test cost and test confid...