1419 search results - page 37 / 284 » Power Droop Testing |
ATS
1996
IEEE
14 years 2 months ago
1996
IEEE
A hierarchical test generation method is presented that uses the inherent hierarchical structure of the circuit under test and takes fault diagnosability into account right from t...
DSD
2005
IEEE
14 years 3 months ago
2005
IEEE
The increasing amount of test data needed to test SOC (System-on-Chip) entails efficient design of the TAM (test access mechanism), which is used to transport test data inside the...
CSDA
2004
13 years 9 months ago
2004
Various exact tests for showing a difference between two treatments or the noninferiority (therapeutic equivalence) based on the difference of two binomial proportions are compare...
KBSE
2010
IEEE
13 years 8 months ago
2010
IEEE
Although testing is central to debugging and software certification, there is no adequate language to specify test suites over source code. Such a language should be simple and c...
DAC
1997
ACM
14 years 2 months ago
1997
ACM
An ATPG technique is proposed that reduces heat dissipation during testing of sequential circuits that have full-scan. The objective is to permit safe and inexpensive testing of l...