1419 search results - page 45 / 284 » Power Droop Testing |
ASPDAC
2007
ACM
14 years 1 months ago
2007
ACM
Abstract-- In this paper, a technique that can efficiently reduce peak and average switching activity during test application is proposed. The proposed method does not require any ...
FLAIRS
2004
13 years 11 months ago
2004
TURING Test technologies are promising ways to validate AI systems which may have no alternative way to indicate validity. Human experts (validators) are often too expensive to in...
SBCCI
2005
ACM
14 years 3 months ago
2005
ACM
Temperature sensors and voltage references require cells that generate both PTAT (Proportional To Absolute Temperature) and NTC (Negative Temperature Coefficient) voltages. We pre...
ATS
2005
IEEE
14 years 3 months ago
2005
IEEE
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
FPL
2004
Springer
14 years 3 months ago
2004
Springer
In order to enable efficient integration of FPGAs into cost effective and reliable high-performance systems as well potentially into low power mobile systems, their power efficienc...