1419 search results - page 5 / 284 » Power Droop Testing |
ICASSP
2010
IEEE
13 years 3 months ago
2010
IEEE
An operational framework is developed for testing stationarity relatively to an observation scale. The proposed method makes use of a family of stationary surrogates for defining ...
DATE
2006
IEEE
14 years 2 months ago
2006
IEEE
Software-based self-test (SBST) of processors offers many benefits, such as dispense with expensive test equipments, test execution during maintenance and in the field or initiali...
MICRO
2011
IEEE
13 years 7 days ago
2011
IEEE
Abstract—Parameter variations have become a dominant challenge in microprocessor design. Voltage variation is especially daunting because it happens so rapidly. We measure and ch...
ISQED
2000
IEEE
14 years 28 days ago
2000
IEEE
Power and energy consumption of digital systems may increase significantly during testing. This extra power consumption due to test application may give rise to severe hazards to ...
ICCAD
2008
IEEE
14 years 5 months ago
2008
IEEE
Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in scan-based testing, the ...