An operational framework is developed for testing stationarity relatively to an observation scale. The proposed method makes use of a family of stationary surrogates for defining ...
Software-based self-test (SBST) of processors offers many benefits, such as dispense with expensive test equipments, test execution during maintenance and in the field or initiali...
Abstract—Parameter variations have become a dominant challenge in microprocessor design. Voltage variation is especially daunting because it happens so rapidly. We measure and ch...
Vijay Janapa Reddi, Svilen Kanev, Wonyoung Kim, Si...
Power and energy consumption of digital systems may increase significantly during testing. This extra power consumption due to test application may give rise to severe hazards to ...
Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in scan-based testing, the ...