296 search results - page 35 / 60 » Power Estimation in Sequential Circuits |
VTS
2005
IEEE
14 years 1 months ago
2005
IEEE
Excessive power supply noise can lead to overkill during delay test. A static compaction algorithm is described in this paper that prevents such overkill. A power supply noise est...
DSD
2008
IEEE
14 years 2 months ago
2008
IEEE
Testability is one of the most important factors that are considered during design cycle along with reliability, speed, power consumption, cost and other factors important for a c...
IOLTS
2005
IEEE
14 years 1 months ago
2005
IEEE
With the aggressive scaling of the CMOS technology parametric variation of the transistor threshold voltage causes significant spread in the circuit delay as well as leakage spect...
PCM
2004
Springer
14 years 1 months ago
2004
Springer
This paper proposes a novel low-power video decoding scheme. In the encoded video bitstream, there are quite a large number of non-coded blocks. When the number of the non-coded bl...
HOST
2008
IEEE
14 years 2 months ago
2008
IEEE
—Masking is a side-channel countermeasure that randomizes side-channel leakage, such as the power dissipation of a circuit. Masking is only effective on the condition that the in...