- The electrical effects of CMOS IC physical defects that caused stuck-openfaults are evaluated, including their voltage levels, quiescent power supply current (IDDQ), transient re...
Jerry M. Soden, R. Keith Treece, Michael R. Taylor...
As the "system-on-a-chip" concept is rapidly becoming a reality, time-to-market and product complexity push the reuse of complex macromodules. Circuits combining a varie...
Embedded processors are increasingly deployed in applications requiring high performance with good real-time characteristics whilst being low power. Parallelism has to be extracte...
— In this paper, we propose a novel channel sounding technique, called the multicarrier direct sequence swept time delay cross-correlation (MC-DS-STDCC), which is designed to min...
Pattern recognition problems span a broad range of applications, where each application has its own tolerance on classification error. The varying levels of risk associated with ma...