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VLSID
1996
IEEE
110views VLSI» more  VLSID 1996»
14 years 13 days ago
On test coverage of path delay faults
W epropose a coverage metric and a two-pass test generation method for path delay faults in combinational logic circuits. The coverage is measured for each line with a rising and ...
Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi...
DDECS
2007
IEEE
90views Hardware» more  DDECS 2007»
14 years 6 days ago
Test Pattern Generator for Delay Faults
A method of generating test pairs for the delay faults is presented in this paper. The modification of the MISR register gives the source of test pairs. The modification of this r...
Tomasz Rudnicki, Andrzej Hlawiczka
KBSE
2007
IEEE
14 years 2 months ago
Direct-dependency-based software compatibility testing
Software compatibility testing is an important quality assurance task aimed at ensuring that component-based software systems build and/or execute properly across a broad range of...
Il-Chul Yoon, Alan Sussman, Atif M. Memon, Adam A....
ESEM
2007
ACM
14 years 5 days ago
A Critical Analysis of Empirical Research in Software Testing
In the foreseeable future, software testing will remain one of the best tools we have at our disposal to ensure software dependability. Empirical studies are crucial to software t...
Lionel C. Briand
CBSE
2011
Springer
12 years 8 months ago
Towards incremental component compatibility testing
Software components are increasingly assembled from other components. Each component may further depend on others, and each may have multiple active versions. The total number of ...
Il-Chul Yoon, Alan Sussman, Atif M. Memon, Adam A....