W epropose a coverage metric and a two-pass test generation method for path delay faults in combinational logic circuits. The coverage is measured for each line with a rising and ...
Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi...
A method of generating test pairs for the delay faults is presented in this paper. The modification of the MISR register gives the source of test pairs. The modification of this r...
Software compatibility testing is an important quality assurance task aimed at ensuring that component-based software systems build and/or execute properly across a broad range of...
Il-Chul Yoon, Alan Sussman, Atif M. Memon, Adam A....
In the foreseeable future, software testing will remain one of the best tools we have at our disposal to ensure software dependability. Empirical studies are crucial to software t...
Software components are increasingly assembled from other components. Each component may further depend on others, and each may have multiple active versions. The total number of ...
Il-Chul Yoon, Alan Sussman, Atif M. Memon, Adam A....