In this paper we propose a novel integrated circuit and architectural level technique to reduce leakage power consumption in high performance cache memories using single Vt (trans...
Long design cycles due to the inability to predict silicon realities is a well-known problem that plagues analog/RF integrated circuit product development. As this problem worsens...
Many testing and analysis techniques have been developed for inhouse use. Although they are effective at discovering defects before a program is deployed, these techniques are oft...
In the last decade, there has been an explosion of online commercial activity enabled by the World Wide Web. An electronic marketplace (e-market) provides an online method to perf...
Adriano M. Pereira, Arlei Silva, Wagner Meira Jr.,...