78 search results - page 6 / 16 » ProB: an automated analysis toolset for the B method |
DAC
2004
ACM
14 years 8 months ago
2004
ACM
Coverage analysis is used to monitor the quality of the verification process. Reports provided by coverage tools help users identify areas in the design that have not been adequat...
DAC
2005
ACM
14 years 8 months ago
2005
ACM
Lowering power is one of the greatest challenges facing the IC industry today. We present a power-aware placement method that simultaneously performs (1) activity-based register c...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Due to increased variability trends in nanoscale integrated circuits, statistical circuit analysis has become essential. We present a novel method for post-silicon analysis that g...
DAC
2009
ACM
14 years 8 months ago
2009
ACM
With aggressive technology scaling, SRAM design has been seriously challenged by the difficulties in analyzing rare failure events. In this paper we propose to create statistical ...
DAC
2002
ACM
14 years 8 months ago
2002
ACM
One of the main goals of coverage tools is to provide the user with informative presentation of coverage information. Specifically, information on large, cohesive sets of uncovere...