Post-silicon validation has recently drawn designers' attention due to its increasing impacts on the VLSI design cycle and cost. One key feature of the post-silicon validatio...
In this paper we present an efficient algorithm for extracting the complete statistical distribution of the input impedance of interconnect structures in the presence of a large n...
In the paper, we propose a new metric for the minimization of area in the generic problem of multiple constant multiplications, and demonstrate its effectiveness for digital FIR f...
The negative effect of electromigration on signal and power line lifetime and functional reliability is an increasingly important problem for the physical design of integrated cir...
Increasingly significant variational effects present a great challenge for delivering desired clock skew reliably. Non-tree clock network has been recognized as a promising approac...