Detecting program phase changes accurately is an important aspect of dynamically adaptable systems. Three dynamic program phase detection techniques are compared – using instruc...
Branch prediction is an important mechanism in modern microprocessor design. The focus of research in this area has been on designing new branch prediction schemes. In contrast, v...
1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...
In this work, an adaptive image compression algorithm is proposed based on the prediction of AC coefficients in Discrete Cosine Transform (DCT) block during reconstruction of image...
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...