Process variations will greatly impact the stability, leakage power consumption, and performance of future microprocessors. These variations are especially detrimental to 6T SRAM ...
Xiaoyao Liang, Ramon Canal, Gu-Yeon Wei, David Bro...
Aggressive technology scaling to 45nm and below introduces serious reliability challenges to the design of microprocessors. Large SRAM structures used for caches are particularly ...
Amin Ansari, Shantanu Gupta, Shuguang Feng, Scott ...
In this paper we introduce Resizable Data Composer-Cache (RDC-Cache). This novel cache architecture operates correctly at sub 500 mV in 65 nm technology tolerating large number of...
Avesta Sasan, Houman Homayoun, Ahmed M. Eltawil, F...
Abstract— The continuing divergence of processor and memory speeds has led to the increasing reliance on larger caches which have become major consumers of area and power in embe...
As SRAM devices are scaled down, the number of variation-induced defective memory cells increases rapidly. Combination of ECC, particularly SECDED, with a redundancy technique can...