129 search results - page 11 / 26 » Process Variations and their Impact on Circuit Operation |
ISQED
2008
IEEE
14 years 1 months ago
2008
IEEE
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
VLSID
2005
IEEE
14 years 7 months ago
2005
IEEE
Synchronous design methods have intrinsic performance overheads due to their use of the global clock and timing assumptions. In future manufacturing processes not only may it beco...
TVLSI
2008
13 years 7 months ago
2008
Abstract--Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact ...
DATE
2010
IEEE
14 years 13 days ago
2010
IEEE
—With every process generation, the problem of variability in physical parameters and environmental conditions poses a great challenge to the design of fast and reliable circuits...
ISQED
2009
IEEE
14 years 2 months ago
2009
IEEE
A system-level statistical analysis methodology is described that captures the impact of inter- and intra-die process variations for read timing failures in SRAM circuit blocks. U...