129 search results - page 19 / 26 » Process Variations and their Impact on Circuit Operation |
DAC
2007
ACM
14 years 8 months ago
2007
ACM
The ability to account for the growing impacts of multiple process variations in modern technologies is becoming an integral part of nanometer VLSI design. Under the context of ti...
DAC
2005
ACM
14 years 8 months ago
2005
ACM
As Si CMOS devices are scaled down into the nanoscale regime, current computer architecture approaches are reaching their practical limits. Future nano-architectures will confront...
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
Abstract— The impact of process variations increases as technology scales to nanometer region. Under large process variations, the path and arc/node criticality [18] provide effe...
GLVLSI
2006
IEEE
14 years 1 months ago
2006
IEEE
Process technology and environment-induced variability of gates and wires in VLSI circuits make timing analyses of such circuits a challenging task. Process variation can have a s...
WCNC
2008
IEEE
14 years 1 months ago
2008
IEEE
A primary constraint in wireless sensor networks (WSNs) is obtaining reliable and prolonged network operation with power-limited sensor nodes. Most of the approaches to the energy ...