129 search results - page 23 / 26 » Process Variations and their Impact on Circuit Operation |
TVLSI
2008
13 years 7 months ago
2008
Data stability of SRAM cells has become an important issue with the scaling of CMOS technology. Memory banks are also important sources of leakage since the majority of transistors...
DAC
2006
ACM
14 years 1 months ago
2006
ACM
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
VLSID
2006
IEEE
14 years 1 months ago
2006
IEEE
This tutorial present the key aspects of design challenges and its solutions that are being experienced in VLSI design in the era of nano technology. The focus will be on design c...
DFT
2004
IEEE
13 years 11 months ago
2004
IEEE
Quantum dot Cellular Automata (QCA) is amongst promising new computing scheme in the nano-scale regimes. As an emerging technology, QCA relies on radically different operations in...
NOCS
2008
IEEE
14 years 1 months ago
2008
IEEE
In this paper we examine a latency insensitive network composed of very fast and simple circuits that connects SoC cores that are also latency insensitive, de-synchronized, or asy...