122 search results - page 8 / 25 » Process variability-aware transient fault modeling and analy... |
ICCAD
2004
IEEE
14 years 4 months ago
2004
IEEE
Abstract—The slack time in real-time systems can be used by recovery schemes to increase system reliability as well as by frequency and voltage scaling techniques to save energy....
ATS
2010
IEEE
13 years 5 months ago
2010
IEEE
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...
IOLTS
2003
IEEE
14 years 25 days ago
2003
IEEE
On-chip global interconnections in very deep submicron technology (VDSM) ICs are becoming more sensitive and prone to errors caused by power supply noise, crosstalk noise, delay v...
MICRO
2003
IEEE
14 years 25 days ago
2003
IEEE
Single-event upsets from particle strikes have become a key challenge in microprocessor design. Techniques to deal with these transient faults exist, but come at a cost. Designers...
ISSRE
2008
IEEE
14 years 1 months ago
2008
IEEE
For many safety-critical systems a safety case is built as part of the certification or acceptance process. The safety case assembles evidence to justify that the design and imple...