2957 search results - page 535 / 592 » Processing Self Corrections |
ICCV
2003
IEEE
14 years 11 months ago
2003
IEEE
The presence of highlights, which in dielectric inhomogeneous objects are linear combination of specular and diffuse reflection components, is inevitable. A number of methods have...
ECCV
2004
Springer
14 years 11 months ago
2004
Springer
This paper proposes a robust estimation and validation framework for characterizing local structures in a positive multi-variate continuous function approximated by a Gaussian-base...
ICDE
2000
IEEE
14 years 10 months ago
2000
IEEE
Time-series data, which are a series of one-dimensional real numbers, have been studied in various database applications. In this paper, we extend the traditional similarity searc...
VIS
2004
IEEE
14 years 10 months ago
2004
IEEE
Accurate estimation of vessel parameters is a prerequisite for automated visualization and analysis of healthy and diseased blood vessels. The objective of this research is to est...
DAC
2008
ACM
14 years 10 months ago
2008
ACM
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...