6274 search results - page 1095 / 1255 » Proofs, Programs, Processes |
DATE
2003
IEEE
14 years 4 months ago
2003
IEEE
Control of variability and performance in the back end of the VLSI manufacturing line has become extremely difficult with the introduction of new materials such as copper and low...
DATE
2003
IEEE
14 years 4 months ago
2003
IEEE
We propose a new metric for evaluation of interconnect architectures. This metric is computed by optimal assignment of wires from a given wire length distribution (WLD) to a given...
DFT
2003
IEEE
14 years 4 months ago
2003
IEEE
1 This paper presents a solution to the test time minimization problem for core-based systems that contain sequential cores with STUMPS architecture. We assume a hybrid BIST approa...
DFT
2003
IEEE
14 years 4 months ago
2003
IEEE
Test scheduling and Test Access Mechanism (TAM) design are two important tasks in the development of a System-on-Chip (SOC) test solution. Previous test scheduling techniques assu...
HICSS
2003
IEEE
14 years 4 months ago
2003
IEEE
Libraries of learning objects may serve as basis for deriving course offerings that are customized to the needs of different learning communities or even individuals. Several ways...