10715 search results - page 209 / 2143 » Proofs from Tests |
129
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VTS
2007
IEEE
15 years 10 months ago
2007
IEEE
We describe estimation of the parameters of a manufacturing test and repair model using data available from that test. The model allows imperfect testing and imperfect repair. The...
128
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SEKE
2007
Springer
15 years 10 months ago
2007
Springer
Some machine learning applications are intended to learn properties of data sets where the correct answers are not already known to human users. It is challenging to test such ML ...
121
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MPC
2004
Springer
15 years 9 months ago
2004
Springer
In this paper we define Kleene algebra with tests in a slightly more general way than Kozen’s definition. Then we give an explicit construction of the free Kleene algebra with...
105
Voted
XPU
2004
Springer
15 years 9 months ago
2004
Springer
Abstract. The paper outlines an experiment conducted in two different academic environments, in which FIT tests were used as a functional requirements specification. Common challen...
109
Voted
ITC
2002
IEEE
15 years 8 months ago
2002
IEEE
1 This paper presents a test input data compression technique, which can be used to reduce input test data volume, test time, and the number of required tester channels. The techni...