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132
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ITC
1995
IEEE
15 years 7 months ago
1995
IEEE
An experiment has been designed to evaluate multiple testing techniques for combinational circuits. To perform the experiment, a 25k gate CMOS Test Chip has been designed, manufac...
121
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SDL
2001
15 years 5 months ago
2001
The purpose of this paper is to describe how computer-aided test generation methods can benefit from the time features and extensions to MSC, SDL and TTCN which are either already ...
124
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ENTCS
2002
15 years 3 months ago
2002
This article discusses mutation testing strategies in the context of refinement. Here, a novel generalization of mutation testing techniques is presented to be applied to contract...
117
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DSD
2010
IEEE
15 years 1 months ago
2010
IEEE
This paper describes an OMAP-based real-time test bench to find the Pareto frontier of an H.264/SVC decoder within a distortion-energy optimization space. A metric to estimate vide...
231
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CP
2009
Springer
16 years 4 months ago
2009
Springer
The goal of testing is to distinguish between a number of hypotheses about a systemfor example, dierent diagnoses of faults by applying input patterns and verifying or falsifying t...