102 search results - page 11 / 21 » Pseudo-Exhaustive Testing of Sequential Circuits |
ATS
1997
IEEE
14 years 3 days ago
1997
IEEE
Testing circuits which do not include a global reset signal requires either complex ATPG algorithms based on 9- or even 256-valued algebras, or some suitable method to generate in...
DSD
2007
IEEE
14 years 2 months ago
2007
IEEE
Similar to sequential test pattern generation, the problem of identifying untestable faults in sequential circuits remains unsolved. Most of the previous works in untestability id...
ICSE
2007
IEEE-ACM
14 years 8 months ago
2007
IEEE-ACM
The Alloy tool-set has been gaining popularity as an alternative to traditional manual testing and checking for design correctness. Alloy uses a first-order relational logic for m...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
Soft error tolerant design becomes more crucial due to exponential increase in the vulnerability of computer systems to soft errors. Accurate estimation of soft error rate (SER), ...
DAC
1997
ACM
14 years 2 days ago
1997
ACM
An ATPG technique is proposed that reduces heat dissipation during testing of sequential circuits that have full-scan. The objective is to permit safe and inexpensive testing of l...