102 search results - page 18 / 21 » Pseudo-Exhaustive Testing of Sequential Circuits |
VLSID
2007
IEEE
14 years 8 months ago
2007
IEEE
The problem of peak power estimation in CMOS circuits is essential for analyzing the reliability and performance of circuits at extreme conditions. The Power Virus problem involves...
DAC
1990
ACM
13 years 12 months ago
1990
ACM
Symbolic simulation involves evaluating circuit behavior using special symbolic values to encode a range of circuit operating conditions. In one simulation run, a symbolic simulat...
PDP
2003
IEEE
14 years 1 months ago
2003
IEEE
As general-purpose parallel computers are increasingly being used to speed up different VLSI applications, the development of parallel algorithms for circuit testing, logic minimi...
ICCAD
2002
IEEE
14 years 4 months ago
2002
IEEE
We present a new method of built-in-self-test (BIST) for sequential circuits and system-on-a-chip (SOC) using characteristic faults and circuitspeciļ¬c spectral information in th...
ICCAD
1999
IEEE
14 years 5 days ago
1999
IEEE
We describe a method referred to as sequence counting to improve on the levels of compaction achievable by vector omission based static compaction procedures. Such procedures are ...