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ICSE
2008
IEEE-ACM
14 years 8 months ago
The effect of program and model structure on mc/dc test adequacy coverage
Ajitha Rajan, Michael W. Whalen, Mats Per Erik Hei...
CAV
2007
Springer
85views Hardware» more  CAV 2007»
14 years 1 months ago
jMoped: A Test Environment for Java Programs
Dejvuth Suwimonteerabuth, Felix Berger, Stefan Sch...