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ETS
2006
IEEE
110views Hardware» more  ETS 2006»
14 years 2 months ago
Deterministic Logic BIST for Transition Fault Testing
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
Valentin Gherman, Hans-Joachim Wunderlich, Jü...
ISESE
2006
IEEE
14 years 2 months ago
Predicting component failures at design time
How do design decisions impact the quality of the resulting software? In an empirical study of 52 ECLIPSE plug-ins, we found that the software design as well as past failure histo...
Adrian Schröter, Thomas Zimmermann, Andreas Z...
SIGMETRICS
2006
ACM
156views Hardware» more  SIGMETRICS 2006»
14 years 2 months ago
Maximizing throughput in wireless networks via gossiping
A major challenge in the design of wireless networks is the need for distributed scheduling algorithms that will efficiently share the common spectrum. Recently, a few distributed...
Eytan Modiano, Devavrat Shah, Gil Zussman
DATE
2005
IEEE
115views Hardware» more  DATE 2005»
14 years 1 months ago
Functional Coverage Driven Test Generation for Validation of Pipelined Processors
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
Prabhat Mishra, Nikil D. Dutt
ISCAS
2005
IEEE
133views Hardware» more  ISCAS 2005»
14 years 1 months ago
Multiobjective VLSI cell placement using distributed simulated evolution algorithm
— Simulated Evolution (SimE) is a sound stochastic approximation algorithm based on the principles of adaptation. If properly engineered it is possible for SimE to reach nearopti...
Sadiq M. Sait, Ali Mustafa Zaidi, Mustafa I. Ali