55 search results - page 7 / 11 » Reconfigurable scan chains: a novel approach to reduce test ... |
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
Transparent-scan was proposed as an approach to test generation and test compaction for scan circuits. Its effectiveness was demonstrated earlier in reducing the test application ...
VTS
2003
IEEE
14 years 21 days ago
2003
IEEE
—We present a dictionary-based test data compression approach for reducing test data volume and testing time in SOCs. The proposed method is based on the use of a small number of...
GLVLSI
2002
IEEE
14 years 11 days ago
2002
IEEE
We present a novel test scheduling algorithm for embedded corebased SoC’s. Given a system integrated with a set of cores and a set of test resources, we select a test for each c...
DATE
2010
IEEE
14 years 15 days ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
DFT
2005
IEEE
13 years 9 months ago
2005
IEEE
Linear decompressors are the dominant methodology used in commercial test data compression tools. However, they are generally not able to exploit correlations in the test data, an...