83 search results - page 7 / 17 » Reducing power density through activity migration |
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
This paper discusses an automated method to build scan chains at the register-transfer level (RTL) for powerconstrained at-speed testing. By analyzing a circuit at the RTL, where ...
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
Traditionally, at early design stages, leakage power is associated with the number of transistors in a design. Hence, intuitively an implementation with minimum resource usage wou...
CLUSTER
2008
IEEE
14 years 2 months ago
2008
IEEE
—The increasing performance and decreasing cost of processors and memory are causing system intelligence to move from the CPU to peripherals such as disk drives. Storage system d...
ICCAD
2007
IEEE
14 years 4 months ago
2007
IEEE
— This paper proposes a selective pattern-compression scheme to minimize both test power and test data volume during scan-based testing. The proposed scheme will selectively supp...
CASES
2007
ACM
13 years 11 months ago
2007
ACM
We propose a technique which leverages configurable data caches to address the problem of cache interference in multitasking embedded systems. Data caches are often necessary to p...