387 search results - page 18 / 78 » Reducing the Costs of Bounded-Exhaustive Testing |
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
We propose a layout-driven test-architecture design and optimization technique for core-based system-on-chips (SoCs) that are fabricated using three-dimensional (3D) integration. ...
SIGSOFT
2010
ACM
13 years 5 months ago
2010
ACM
Reliance on skilled developers reduces the return on investment for important software engineering tasks such as establishing program correctness. This position paper introduces a...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
Many SOCs today contain both digital and analog embedded cores. Even though the test cost for such mixed-signal SOCs is significantly higher than that for digital SOCs, most prio...
ATS
2001
IEEE
13 years 11 months ago
2001
IEEE
Testing and diagnosis are important issues in system-onchip (SOC) development, as more and more embedded cores are being integrated into the chips. In this paper we propose a buil...
ICFEM
2003
Springer
14 years 24 days ago
2003
Springer
Abstract. Errors in a requirements model have prolonged detrimental effects on reliability, cost, and safety of a software system. It is very costly to fix these errors in later ...