Sciweavers

387 search results - page 6 / 78
» Reducing the Costs of Bounded-Exhaustive Testing
Sort
View
VLSID
2002
IEEE
95views VLSI» more  VLSID 2002»
14 years 8 months ago
A Novel Method to Improve the Test Efficiency of VLSI Tests
This paper considers reducing the cost of test application by permuting test vectors to improve their defect coverage. Algorithms for test reordering are developed with the goal o...
Hailong Cui, Sharad C. Seth, Shashank K. Mehta
CORR
2010
Springer
102views Education» more  CORR 2010»
13 years 7 months ago
MIREX: MapReduce Information Retrieval Experiments
We propose to use MapReduce to quickly test new retrieval approaches on a cluster of machines by sequentially scanning all documents. We present a small case study in which we use...
Djoerd Hiemstra, Claudia Hauff
DATE
2010
IEEE
185views Hardware» more  DATE 2010»
14 years 19 days ago
Adapting to adaptive testing
Adaptive testing is a generic term for a number of techniques which aim at improving the test quality and/or reducing the test application costs. In adaptive tests, the test conte...
Erik Jan Marinissen, Adit Singh, Dan Glotter, Marc...
JIPS
2010
160views more  JIPS 2010»
13 years 2 months ago
A Regression Test Selection and Prioritization Technique
Regression testing is a very costly process performed primarily as a software maintenance activity. It is the process of retesting the modified parts of the software and ensuring t...
Ruchika Malhotra, Arvinder Kaur, Yogesh Singh
PKDD
2005
Springer
167views Data Mining» more  PKDD 2005»
14 years 1 months ago
Hybrid Cost-Sensitive Decision Tree
Cost-sensitive decision tree and cost-sensitive naïve Bayes are both new cost-sensitive learning models proposed recently to minimize the total cost of test and misclassifications...
Shengli Sheng, Charles X. Ling