873 search results - page 80 / 175 » Reducing the Frequent Pattern Set |
LREC
2008
13 years 9 months ago
2008
This paper presents various strategies for improving the extraction performance of less prominent relations with the help of the rules learned for similar relations, for which lar...
JSS
2007
13 years 8 months ago
2007
A control flow trace captures the complete sequence of dynamically executed basic blocks and function calls. It is usually of very large size and therefore commonly stored in com...
ASPDAC
1998
ACM
14 years 9 days ago
1998
ACM
— Test Pattern Generation for combinational circuits entails the identification of primary input assignments for detecting each fault in a set of target faults. An extension to ...
ICIP
2008
IEEE
14 years 9 months ago
2008
IEEE
We consider the problem of reconstructing time sequences of spatially sparse signals (with unknown and time-varying sparsity patterns) from a limited number of linear "incohe...
ISVLSI
2008
IEEE
14 years 2 months ago
2008
IEEE
With the advent of nanometer technologies, the design size of integrated circuits is getting larger and the operation speed is getting faster. As a consequence, test cost is becom...