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VLSID
2010
IEEE
155views VLSI» more  VLSID 2010»
13 years 5 months ago
Synchronized Generation of Directed Tests Using Satisfiability Solving
Directed test generation is important for the functional verification of complex system-on-chip designs. SAT based bounded model checking is promising for counterexample generatio...
Xiaoke Qin, Mingsong Chen, Prabhat Mishra
ICAC
2006
IEEE
14 years 1 months ago
Using Autonomic Principles to Manage Converged Services in Next Generation Networks
Network resources will always be heterogeneous, and thus have different functionalities and programming models. This adversely affects interoperability. Seamless Mobility is one e...
John Strassner
SAB
2010
Springer
226views Optimization» more  SAB 2010»
13 years 5 months ago
Distributed Online Learning of Central Pattern Generators in Modular Robots
Abstract. In this paper we study distributed online learning of locomotion gaits for modular robots. The learning is based on a stochastic approximation method, SPSA, which optimiz...
David Johan Christensen, Alexander Spröwitz, ...
ITC
1997
IEEE
129views Hardware» more  ITC 1997»
13 years 11 months ago
On Using Machine Learning for Logic BIST
This paper presents a new approach for designing test sequences to be generated on–chip. The proposed technique is based on machine learning, and provides a way to generate effi...
Christophe Fagot, Patrick Girard, Christian Landra...
ICML
2008
IEEE
14 years 8 months ago
Extracting and composing robust features with denoising autoencoders
Previous work has shown that the difficulties in learning deep generative or discriminative models can be overcome by an initial unsupervised learning step that maps inputs to use...
Pascal Vincent, Hugo Larochelle, Yoshua Bengio, Pi...