128 search results - page 13 / 26 » Relationships between Test Suites, Faults, and Fault Detecti... |
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
We present an approach to prevent overtesting in scan-based delay test. The test data is transformed with respect to functional constraints while simultaneously keeping as many po...
VEE
2012
ACM
12 years 2 months ago
2012
ACM
In software for embedded systems, the frequent use of interrupts for timing, sensing, and I/O processing can cause concurrency faults to occur due to interactions between applicat...
ITC
1997
IEEE
13 years 11 months ago
1997
IEEE
This paper presents a new approach for designing test sequences to be generated on–chip. The proposed technique is based on machine learning, and provides a way to generate effi...
ESEM
2007
ACM
13 years 9 months ago
2007
ACM
An important number of studies have addressed the importance of models in software engineering, mainly in the design of robust software systems. Although models have been proven t...
ICST
2010
IEEE
13 years 5 months ago
2010
IEEE
A Feature Model (FM) is a compact representation of all the products of a software product line. The automated extraction of information from FMs is a thriving research topic invo...