693 search results - page 38 / 139 » Reliability Mechanisms for Very Large Storage Systems |
GEOINFO
2007
13 years 9 months ago
2007
This article presents the evolution of a very large geospatial database and application developed for telecommunications outside plant management. The needs for the construction of...
EMSOFT
2005
Springer
14 years 1 months ago
2005
Springer
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...
MICRO
2007
IEEE
14 years 2 months ago
2007
IEEE
As silicon process technology scales deeper into the nanometer regime, hardware defects are becoming more common. Such defects are bound to hinder the correct operation of future ...
ASAP
2007
IEEE
13 years 8 months ago
2007
IEEE
Commercial designs are integrating from 10 to 100 embedded functional and storage blocks in a single system on chip (SoC) currently, and the number is likely to increase significa...
BMCBI
2011
13 years 2 months ago
2011
Background: OmniLog™ phenotype microarrays (PMs) have the capability to measure and compare the growth responses of biological samples upon exposure to hundreds of growth condit...