463 search results - page 21 / 93 » Reliability and Power Management of Integrated Systems |
MICRO
2007
IEEE
14 years 2 months ago
2007
IEEE
Aggressive technology scaling over the years has helped improve processor performance but has caused a reduction in processor reliability. Shrinking transistor sizes and lower sup...
AVSS
2008
IEEE
13 years 8 months ago
2008
IEEE
Moving object classification in far-field video is a key component of smart surveillance systems. In this paper, we propose a reliable system for person-vehicle classification whi...
FAST
2011
12 years 11 months ago
2011
This work analyzes the stochastic behavior of writing to embedded flash memory at voltages lower than recommended by a microcontroller’s specifications to reduce energy consum...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
— Technology scaling has caused the feature sizes to shrink continuously, whereas interconnects, unlike transistors, have not followed the same trend. Designing 3D stack architec...
COMCOM
2006
13 years 7 months ago
2006
Recent technological advances in sensors, low-power integrated circuits, and wireless communications have enabled the design of lowcost, miniature, lightweight, and intelligent ph...