282 search results - page 26 / 57 » Reliability- and process-variation aware design of integrate... |
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
In deep submicron circuits, elevation in temperatures has brought new challenges in reliability, timing, performance, cooling costs and leakage power. Conventional thermal managem...
DAC
2007
ACM
14 years 10 months ago
2007
ACM
Abstract-- The PPV is a robust phase domain macromodel for oscillators. It has been proven to predict oscillators' responses correctly under small signal perturbations, and ca...
DAC
2007
ACM
14 years 10 months ago
2007
ACM
The number and magnitude of process variation sources are increasing as we scale further into the nano regime. Today's most successful response surface methods limit us to lo...
DAC
2010
ACM
14 years 29 days ago
2010
ACM
The identification of speedpaths is required for post-silicon (PS) timing validation, and it is currently becoming timeconsuming due to manufacturing variations. In this paper we...
GLVLSI
2006
IEEE
14 years 3 months ago
2006
IEEE
Process technology and environment-induced variability of gates and wires in VLSI circuits make timing analyses of such circuits a challenging task. Process variation can have a s...